Description :

1. Analytical probe station for various application.
2. Accessory part:
(1) Microscope tilting mechanism.
(2) RF probes/ cables.
(3) Active probes.
(4) Low current/ capacitance probes.
(5) High voltage probe.
(6) Laser cutter.
(7) Ultrasonic cutter.
(8) CCD/Digital camera with usb connection.
(9) Probe card/ package device/PCB holder.
(10) Thermal systems.
(11) Liquid crystal kit.
(12) Vibration free table.
(13) Shielding box.
(14) Test bench.
(15) Dark field/normarski inspection.
(16) Photon emission microscope system.

Specification :

Specification:

1. Gold plated vacuum chuck: 4", 6", 8", 12".

2. Sample size: 5 x 5mm ~ 4", 6", 8", 12".

3. Chuck flatness: 10um.

4. Chuck theta: ±15°.

5. Chuck quick Y stage for easy loading/unloading the samples.

6. Huge knob X-Y stage: 1um resolution.

7. Platen lever/knob up/down.

8. Microscope tilting for easy revolving objectives.

• 
  Probe Stations
• 
  4" Probe Stations
• 
  Cryogenic Prober Station